Aseem Routray, KPIT Technologies
Our aim is to improve the design margin by providing the electrical signature of a fault on various subsystems dependent in a direct or indirect way. The framework allows us to run iterations on possible combinations of faults at subsystem levels as well as at wire fault levels and use the recorded data for impact analysis of subsystem failures on the entire system. While it increases the number of cases in the failure mode analysis, it results in a significant reduction of the cost and time required for testing. The inputs are taken from an optimized orthogonal matrix generated based on the probability of occurrence of a fault out of the manifold combinations of fault injection possible in the framework. The effect is generated by a high-fidelity comprehensive electric vehicle model that facilitates the injection of these faults and provides data for root cause identification of observed failures, thus making way for future prognostics.
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